SCOPUS 정보 검색 플랫폼

Microelectronic Engineering

Volumn 88, Issue 8, 2011, Pages 2759-2762

Novel gold cantilever for nano-Raman spectroscopy of graphene

(3) Snitka, Valentinas a Rodrigues, Raul D a Lendraitis, Vitas a

a KAUNAS UNIVERSITY OF TECHNOLOGY (Lithuania)

Author keywords

Atomic force microscopy; Graphene; Nano Raman; Tip enhanced

Indexed keywords

DEVICE APPLICATION; FORCE SENSOR; GRAPHENE LAYERS; LOCAL STRESS DISTRIBUTION; MICRO WIRE; NANO-RAMAN; NONDESTRUCTIVE IDENTIFICATION; NUMBER OF LAYERS; OPTICAL ANTENNAS; PROBE TIPS; RAMAN IMAGING; SINGLE LAYER; TAPPING MODES; TAPPING-MODE ATOMIC FORCE MICROSCOPY; TIP-ENHANCED; TIP-ENHANCED RAMAN SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; NANOCANTILEVERS; NANOSENSORS; PROBES; RAMAN SCATTERING; RAMAN SPECTROSCOPY; STRESS ANALYSIS; STRESS CONCENTRATION;

GRAPHENE;

EID: 79960062328 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2011.02.046 Document Type: Conference Paper

Times cited : (55)

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