Statistical analysis of atomic force microscopy and Raman spectroscopy data for estimation of graphene layer numbers

Physica Status Solidi (B) Basic Research

Volumn 245, Issue 10, 2008, Pages 2055-2059

  Obraztsova, Ekaterina A ^a,b   Osadchy, Alexander V ^b   Obraztsova, Elena D ^b   Lefrant, Serge ^c   Yaminsky, Igor V ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^c INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 54949149598     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200879657     Document Type: Conference Paper

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