Interfacial orientation and misorientation relationships in nanolamellar Cu/Nb composites using transmission-electron-microscope-based orientation and phase mapping

Acta Materialia

Volumn 64, Issue , 2014, Pages 333-344

  Liu, X ^a   Nuhfer, N T ^a   Rollett, A D ^a   Sinha, S ^a   Lee, S B ^b   Carpenter, J S ^c   Ledonne, J E ^a   Darbal, A ^d   Barmak, K ^e  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b Ulsan National Institute of Science and Technology   (South Korea)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d NanoMEGAS USA ^*  (United States)

^e Department of Earth and Environmental Sciences   (United States)

Author keywords

Accumulative roll bonding (ARB); Heterophase interface character distribution (HICD); Interface structure; Orientation relation (OR); Transmission electron microscopy (TEM)

Indexed keywords

ACCUMULATED ROLL BONDINGS; ACCUMULATIVE ROLL BONDING; ELECTRON BACK-SCATTERED DIFFRACTION; HETEROPHASE INTERFACE CHARACTER DISTRIBUTIONS; INTERFACE STRUCTURES; INTERFACIAL ORIENTATION; ORIENTATION RELATIONS; TEXTURE INFORMATION;

DIFFRACTION; MICROSCOPES; ROLL BONDING; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 84892369863     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2013.10.046     Document Type: Article

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