Soft error sensitivity characterization for microprocessor dependability enhancement strategy

Proceedings of the 2002 International Conference on Dependable Systems and Networks

Volumn , Issue , 2002, Pages 416-425

  Kim, Seongwoo ^a   Somani, Arun K ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUIT LAYOUT; JAVA PROGRAMMING LANGUAGE; LOGIC GATES; PROGRAM DIAGNOSTICS; PROGRAM PROCESSORS; VLSI CIRCUITS;

LOGIC BLOCK; MICROARCHITECTURE; REGISTER TRANSFER LEVEL; SOFT ERROR SENSITIVITY;

MICROPROCESSOR CHIPS;

EID: 0036926873     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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