Thickness dependence of FTO over-layer on properties of FTO/FZO bilayer

Materials and Manufacturing Processes

Volumn 28, Issue 12, 2013, Pages 1322-1326

  Ravichandran, K ^a   Anandhi, R ^a   Sakthivel, B ^a   Swaminathan, K ^b   Ravikumar, P ^a   Jabena Begum, N ^a   Snega, S ^a  

^a A V V M SRI PUSHPAM COLLEGE   (India)

^b VIVEKANANDA COLLEGE   (India)

Author keywords

Electric; Films; Optical; Photovoltaics; Semiconductors; Spray; XRD; Zinc

Indexed keywords

ELECTRIC; OPTICAL; OPTOELECTRONIC APPLICATIONS; PHOTOVOLTAICS; SPRAY-PYROLYSIS TECHNIQUES; THICKNESS DEPENDENCE; TRANSPARENT CONDUCTING OXIDE FILMS; XRD;

FILMS; OXIDE FILMS; SEMICONDUCTOR MATERIALS; SPRAY PYROLYSIS; SPRAYING; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

CONDUCTIVE FILMS;

EID: 84890524152     PISSN: 10426914     EISSN: 15322475     Source Type: Journal    
DOI: 10.1080/10426914.2013.852223     Document Type: Article

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