Calculations of mean escape depths of photoelectrons in elemental solids excited by linearly polarized X-rays for high-energy photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 190, Issue PART B, 2013, Pages 127-136

  Tanuma, S ^a   Yoshikawa, H ^a   Shinotsuka, H ^b   Ueda, R ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b Advanced Algorithm and Systems Co Ltd   (Japan)

Author keywords

Asymmetry parameter; High energy photoelectron spectroscopy; Linearly polarized X rays; Mean escape depth

Indexed keywords

ASYMMETRY PARAMETER; ATOMIC POTENTIAL; ELECTRON INELASTIC MEAN FREE PATHS; ENERGY DEPENDENCE; ESCAPE DEPTH; EXPERIMENTAL CONDITIONS; LINEARLY POLARIZED; PREDICTIVE EQUATIONS;

ELASTIC SCATTERING; MONTE CARLO METHODS; PHOTOELECTRONS; PHOTONS; POLARIZATION; X RAYS;

PHOTOELECTRON SPECTROSCOPY;

EID: 84890119850     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2013.08.011     Document Type: Article

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