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Volumn 52, Issue 11 PART 1, 2013, Pages

Characterizing edge and stacking structures of exfoliated graphene by photoelectron diffraction

(8) Matsui, Fumihiko a Ishii, Ryo a Matsuda, Hiroyuki a Morita, Makoto a Kitagawa, Satoshi a Matsushita, Tomohiro b Koh, Shinji a,c Daimon, Hiroshi a

a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY (Japan)

b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

c AOYAMA GAKUIN UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE GRAPHITE; EXFOLIATED GRAPHENE; INTERFACIAL INTERACTION; INTERFERENCE PATTERNS; PHOTOELECTRON DIFFRACTION; PHOTOELECTRON INTENSITIES; RAMAN SPECTROMICROSCOPY; STACKING STRUCTURES;

BINDING ENERGY; CRYSTALLINE MATERIALS; DIFFRACTION; GRAPHITE; MONOLAYERS;

GRAPHENE;

EID: 84889036722 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.7567/JJAP.52.110110 Document Type: Article

Times cited : (7)

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