Application-dependent testing of FPGA delay faults

Conference Proceedings of the EUROMICRO

Volumn 1, Issue , 1999, Pages 260-267

  Krasniewski, Andrej ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

BIST TECHNIQUES; PROGRAMMABLE LOGIC; PSEUDO-EXHAUSTIVE TESTING; RANDOM TESTING; REPROGRAMMABLE; TEST PATTERN GENERATOR; TIMING CHARACTERISTICS; USER DEFINED FUNCTIONS;

BUILT-IN SELF TEST; INFORMATION SCIENCE; SOFTWARE TESTING; TIMING CIRCUITS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 84889013047     PISSN: 10896503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EURMIC.1999.794478     Document Type: Conference Paper

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