On the generation of pseudo-deterministic two-patterns test sequence with LFSRs

Proceedings of European Design and Test Conference

Volumn , Issue , 1997, Pages 69-76

  Dufaza, Christian ^a   Zorian, Yervant ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; CONSTRAINT THEORY; ELECTRIC NETWORK SYNTHESIS; LOGIC GATES; MATHEMATICAL MODELS; RANDOM PROCESSES;

BUILT IN SELF TEST (BIST) PATTERN GENERATORS; LINEAR FEEDBACK SHIFT REGISTERS (LFSR);

SHIFT REGISTERS;

EID: 0030646141     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (31)