In situ TEM study of catalytic nanoparticle reactions in atmospheric pressure gas environment

Microscopy and Microanalysis

Volumn 19, Issue 6, 2013, Pages 1558-1568

  Xin, Huolin L ^a   Niu, Kaiyang ^a   Alsem, Daan Hein ^b   Zheng, Haimei ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b Hummingbird Scientific   (United States)

Author keywords

environmental cells; environmental TEM; gas flow; in situ TEM; Kirkendall effects; nanoscale reactions

Indexed keywords

EID: 84888016183     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927613013433     Document Type: Article

References (36)

1. ACCUTECH CO. (n.d.). Gas/compressible flow calculation notes (FluidFlow3 Design Note 05). Available at http://www.accutech2000.com.au/FluidFlow3/Support/ Modelling%20and %20Design%20Notes/Modelling%20and%20Design%20Note %2005%20%20Gas%20Flow.pdf
2. ALLARD, L.F., OVERBURY, S.H., BIGELOW, W.C., KATZ, M.B., NAC-KASHI, D.P. & DAMIANO, J. (2012). Novel MEMS-based gas-cell/heating specimen holder provides advanced imaging capabilities for in situ reaction studies. Microsc Microanal 18, 656-666.
3. ATKINSON, A. (1986). Diffusion in oxides of the first transition series metals. DTIC Document. Available at www.dtic.mil/dtic/tr/fulltext/u2/a196091. pdf.
4. BOYES, E.D. & GAI, P.L. (1997). Environmental high resolution electron microscopy and applications to chemical science. Ultra-microscopy 67, 219-232.
5. CARTER, C.B. & WILLIAMS, D. (2009). Transmission Electron Microscopy. New York: Springer-Verlag.
6. CHEN, W.K., PETERSON, N.L. & REEVES, W.T. (1969). Isotope effect for cation self-diffusion in CoO crystals. Phys Rev 186, 887-891.
7. CHENNA, S., BANERJEE, R. & CROZIER, P.A. (2011). Atomic-scale observation of the Ni activation process for partial oxidation of methane using in situ environmental TEM. Chem Cat Chem 3, 1051-1059.
8. CHUANG, W.-H., LUGER, T., FETTIG, R.K. & GHODSSI, R. (2004). Mechanical property characterization of LPCVD silicon nitride thin films at cryogenic temperatures. J Microelectromech Sys 13, 870-879.
9. CRANE CO. (ED.). (2011). Flow of Fluids through Valves, Fittings and Pipe. Stamford, CT: Crane.
10. CREEMER, J.F., HELVEG, S., HOVELING, G.H., ULLMANN, S., MOLEN-BROEK, A.M., SARRO, P.M. & ZANDBERGEN, H.W. (2008). Atomic-scale electron microscopy at ambient pressure. Ultramicroscopy 108, 993-998.
11. DE JONGE, N., BIGELOW, W.C. & VEITH, G.M. (2010). Atmospheric pressure scanning transmission electron microscopy. Nano Lett 10, 1028-1031.
12. DE JONGE, N. & ROSS, F.M. (2011). Electron microscopy of specimens in liquid. Nat Nano 6, 695-704.
13. EGERTON, R.F. (2011). Electron Energy-Loss Spectroscopy in the Electron Microscope, 3rd ed. New York: Springer Science + Business Media.
14. FRANCES, M.R. (2010). Controlling nanowire structures through real time growth studies. Rep Prog Phys 73, 114501.
15. GOLDSTEIN, J., NEWBURY, D.E., JOY, D.C., LYMAN, C.E., ECHLIN, P., LIFSHIN, E., SAWYER, L. & MICHAEL, J.R. (2003). Scanning Electron Microscopy and X-Ray Microanalysis, 3rd ed. New York: Springer.
16. GUSAK, A.M., ZAPOROZHETS, T.V., TU, K.N. & GÖSELE, U. (2005). Kinetic analysis of the instability of hollow nanoparticles. Phi-los Mag 85, 4445-4464.
17. s-corrected ultrahigh-resolution TEM. Ultramicroscopy 108, 167-178.
18. HANSEN, PL., WAGNER, J.B., HELVEG, S., ROSTRUP-NIELSEN, J.R., CLAUSEN, B.S. & TOPS"E, H. (2002). Atom-resolved imaging of dynamic shape changes in supported copper nanocrystals. Science 295, 2053-2055.
19. HANSEN, T.W. & WAGNER, J.B. (2012). Environmental transmission electron microscopy in an aberration-corrected environment. Microsc Microanal 18, 684-690.
20. HATTY, V., KAHN, H. & HEUER, A.H. (2008). Fracture toughness, fracture strength, and stress corrosion cracking of silicon dioxide thin films. J Microelectromech Sys 17, 943-947.
21. JINSCHEK, J.R. & HELVEG, S. (2012). Image resolution and sensitivity in an environmental transmission electron microscope. Micron 43, 1156-1168.
22. KISIELOWSKI, C, FREITAG, B., BISCHOFF, M., VAN LIN, H., LAZAR, S., KNIPPELS, G., TIEMEIJER, P., VAN DER STAM, M., VON HAR-RACH, S., STEKELENBURG, M., HAIDER, M., UHLEMANN, S., MÜLLER, H., HARTEL, P., KABIUS, B., MILLER, D., PETROV, I., OLSON, E.A., DONCHEV, T., KENIK, E.A., LUPINI, A.R., BENTLEY, J., PENNYCOOK, S.J., ANDERSON, I.M., MINOR, A.M., SCHMID, A.K., DUDEN, T., RADMILOVIC, V., RAMASSE, Q.M., WATANABE, M., ERNI, R., STACH, E.A., DENES, P. & DAHMEN, U. (2008). Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit. Microsc Microanal 14, 469-477.
23. RAILSBACK, J.G., JOHNSTON-PECK, A.C., WANG, J. & TRACY, JB (2010). Size-dependent nanoscale Kirkendall effect during the oxidation of nickel nanoparticles. ACS Nano 4, 1913-1920.
24. REED, S. (1982). The single-scattering model and spatial resolution in X-ray analysis of thin foils. Ultramicroscopy 7, 405-409.
25. REZ, P. (1983). A transport equation theory of beam spreading in the electron microscope. Ultramicroscopy 12, 29-38.
26. SHARMA, R. (2001). Design and applications of environmental cell transmission electron microscope for in situ observations of gas-solid reactions. Microsc Microanal 7, 494-506.
27. SHARMA, R. & WEISS, K. (1998). Development of a TEM to study in situ structural and chemical changes at an atomic level during gas-solid interactions at elevated temperatures. Microsc Res Tech 42, 270-280.
28. SMITH, J.M., VAN NESS, H.C. & ABBOTT, M. (2004). Introduction to Chemical Engineering Thermodynamics. New York: McGraw-Hill.
29. SUN, L., NOH, K.W., WEN, J.-G. & DILLON, S.J. (2011). In situ transmission electron microscopy observation of silver oxidation in ionized/atomic gas. Langmuir 27, 14201-14206.
30. VAN AERT, S., CHEN, J.H. & VAN DYCK, D (2010). Linear versus non-linear structural information limit in high-resolution transmission electron microscopy. Ultramicroscopy 110, 1404-1410.
31. VENDELBO, S.B., KOOYMAN, P.J., CREEMER, J.F., MORANA, B., MELE, L., DONA, P., NELISSEN, B.J. & HELVEG, S. (2013). Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy. Ultramicroscopy 133, 72-79.
32. VLASSAK, J. & NIX, W. (1992). New bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films. J Mater Res 7, 3242-3249.
33. YAGUCHI, T, SUZUKI, M., WATABE, A., NAGAKUBO, Y, UEDA, K. & KAMINO, T. (2011). Development of a high temperature-atmospheric pressure environmental cell for high-resolution TEM. J Electron Microsc 60, 217-225.
34. YIN, Y, RIOUX, R.M., ERDONMEZ, C.K., HUGHES, S., SOMORJAI, G.A. &ALIVISATOS, A.P. (2004). Formation of hollow nanocrystals through the nanoscale Kirkendall effect. Science 304, 711-714.
35. YOKOSAWA, T, ALAN, T, PANDRAUD, G., DAM, B. & ZANDBERGEN, H. (2012). In-situ TEM on (de)hydrogenation of Pd at 0.5-4.5 bar hydrogen pressure and 20-400°C. Ultramicroscopy 112, 47-52.
36. YOSHIDA, H., KUWAUCHI, Y, JINSCHEK, J.R., SUN, K., TANAKA, S., KOHYAMA, M., SHIMADA, S., HARUTA, M. & TAKEDA, S. (2012). Visualizing gas molecules interacting with supported nanopar-ticulate catalysts at reaction conditions. Science 335, 317-319.