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Volumn 25, Issue 42, 2013, Pages 6128-6132

Local temperature redistribution and structural transition during joule-heating-driven conductance switching in VO2

Author keywords

joule heating; memristors; mott transition; peierls transition; vanadium dioxide

Indexed keywords

CONDUCTANCE SWITCHING; MOTT TRANSITIONS; OPTICAL CHARACTERIZATION; PEIERLS TRANSITION; SCANNING TRANSMISSION X RAY MICROSCOPY; STRUCTURAL PHASE TRANSITION; STRUCTURAL TRANSITIONS; VANADIUM DIOXIDE;

EID: 84887437298     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201302046     Document Type: Article
Times cited : (206)

References (31)
  • 28
    • 84887417883 scopus 로고    scopus 로고
    • Emissivity-corrected infrared thermal pulse measurement on microscopic semiconductor targets", presented at, Orlando, Fl, Apr 16-19.
    • G. Albright, J. Stump, C. P. Li, H. Kaplan, "Emissivity-corrected infrared thermal pulse measurement on microscopic semiconductor targets", presented at Thermosense XXIII Conference, Orlando, Fl, Apr 16-19, 2001.
    • (2001) Thermosense XXIII Conference
    • Albright, G.1    Stump, J.2    Li, C.P.3    Kaplan, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.