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Journal of Applied Physics

Volumn 110, Issue 3, 2011, Pages

Studies on electric triggering of the metal-insulator transition in VO 2 thin films between 77 K and 300 K

(5) Yang, Zheng a Hart, Sean a Ko, Changhyun a Yacoby, Amir a Ramanathan, Shriram a

a HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; CARRIER INJECTION; FIELD EFFECTS; JOULE HEATING EFFECT; OXIDE ELECTRONICS; PHASE TRANSITION PROPERTIES; SCALING BEHAVIOR; STRUCTURAL PHASE TRANSITION; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; TRANSITION MECHANISM;

ACTIVATION ENERGY; METAL INSULATOR BOUNDARIES; SEMICONDUCTOR INSULATOR BOUNDARIES; THICK FILMS; THIN FILMS; THRESHOLD VOLTAGE;

METAL INSULATOR TRANSITION;

EID: 80051951721 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3619806 Document Type: Article

Times cited : (67)

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