Thermal property microscopy with frequency domain thermoreflectance

Review of Scientific Instruments

Volumn 84, Issue 10, 2013, Pages

  Yang, Jia ^a   Maragliano, Carlo ^b   Schmidt, Aaron J ^a  

^a Boston University   (United States)

^b KHALIFA UNIVERSITY   (United Arab Emirates)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DOMAINS; MAXIMUM SENSITIVITY; MICROSCOPY TECHNIQUE; MULTIPLE FREQUENCY; PHASE-VERSUS-FREQUENCY; SILICON SUBSTRATES; SURFACE REFLECTIVITY; THERMAL INTERFACES;

FREQUENCY DOMAIN ANALYSIS; HYBRID MATERIALS; IMAGING TECHNIQUES; INTERFACES (MATERIALS); THERMAL CONDUCTIVITY OF SOLIDS;

THERMODYNAMIC PROPERTIES;

EID: 84887385514     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4824143     Document Type: Article

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