Simultaneous measurement of thermal conductivity and heat capacity of bulk and thin film materials using frequency-dependent transient thermoreflectance method

Review of Scientific Instruments

Volumn 84, Issue 3, 2013, Pages

  Liu, Jun ^a   Zhu, Jie ^b   Tian, Miao ^a   Gu, Xiaokun ^a   Schmidt, Aaron ^c   Yang, Ronggui ^a  

^a University of Colorado at Boulder   (United States)

^b INSTITUTE OF ENGINEERING THERMOPHYSICS   (China)

^c Boston University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT CAPACITY MEASUREMENTS; HYBRID ORGANIC-INORGANIC; MEASUREMENT TECHNIQUES; SIMULTANEOUS MEASUREMENT; THERMAL PROPERTIES OF NANOSTRUCTURES; TIME DOMAIN THERMOREFLECTANCE; TRANSIENT THERMOREFLECTANCE; VOLUMETRIC HEAT CAPACITY;

DEPOSITION; MATERIALS; MEASUREMENTS; NANOSTRUCTURES; SPECIFIC HEAT; THIN FILMS; TIME DOMAIN ANALYSIS; VAPOR DEPOSITION;

THERMAL CONDUCTIVITY;

NANOMATERIAL; SILICON; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; HEAT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; TEMPERATURE; THERMAL CONDUCTIVITY; PROCEDURES;

ELECTRIC CONDUCTIVITY; EQUIPMENT DESIGN; HOT TEMPERATURE; MATERIALS TESTING; NANOSTRUCTURES; NANOTECHNOLOGY; SILICON; SILICON DIOXIDE; TEMPERATURE; THERMAL CONDUCTIVITY;

EID: 84875792832     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4797479     Document Type: Article

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