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Volumn 102, Issue 8, 2013, Pages

Influence of interfacial properties on thermal transport at gold:silicon contacts

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION LAYER; INTERFACIAL PROPERTY; INTERFACIAL ROUGHNESS; KAPITZA CONDUCTANCE; PRE-TREATMENTS; STRUCTURAL DISORDERS; THERMAL TRANSPORT; TIME DOMAIN THERMOREFLECTANCE;

EID: 84874904216     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4793431     Document Type: Article
Times cited : (81)

References (41)
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    • D. G. Cahill, Rev. Sci. Instrum. 75, 5119 (2004). 10.1063/1.1819431
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    • Cahill, D.G.1
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    • 0000946149 scopus 로고
    • 10.1103/PhysRevB.48.16373
    • R. J. Stoner and H. J. Maris, Phys. Rev. B 48, 16373 (1993). 10.1103/PhysRevB.48.16373
    • (1993) Phys. Rev. B , vol.48 , pp. 16373
    • Stoner, R.J.1    Maris, H.J.2
  • 31
    • 0000061661 scopus 로고
    • 10.1139/p59-037
    • W. A. Little, Can. J. Phys. 37, 334 (1959). 10.1139/p59-037
    • (1959) Can. J. Phys. , vol.37 , pp. 334
    • Little, W.A.1
  • 34
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  • 40


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.