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Volumn 108, Issue 9, 2010, Pages

Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films

(6) Zhu, Jie a,b Tang, Dawei b Wang, Wei a Liu, Jun a Holub, Kristopher W a Yang, Ronggui a

a UCB 450 (United States)

b INSTITUTE OF ENGINEERING THERMOPHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

A-THERMAL; DIFFERENT FREQUENCY; FREQUENCY DOMAINS; FREQUENCY SELECTION; HEAT TRANSPORT; HIGH PRECISION; MEASUREMENT RESULTS; MODULATION FREQUENCIES; REGIME MAP; THERMAL CONDUCTANCE; THERMAL PROPERTIES; THERMOREFLECTANCE; THIN FILM METAL; TIME DOMAIN THERMOREFLECTANCE; TRILAYER STRUCTURE; ULTRA-FAST; ULTRAFAST LASER;

DISSIMILAR MATERIALS; MEASUREMENTS; SILICON COMPOUNDS; THERMAL CONDUCTIVITY; THERMAL CONDUCTIVITY OF SOLIDS; THERMOANALYSIS; THERMODYNAMIC PROPERTIES; THIN FILMS; ULTRAFAST LASERS; VAPOR DEPOSITION;

TIME DOMAIN ANALYSIS;

EID: 78649239146 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3504213 Document Type: Article

Times cited : (199)

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