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Volumn 19, Issue 8, 1999, Pages 1631-1639

Measuring the anisotropic thermal diffusivity of silicon nitride grains by thermoreflectance microscopy

Author keywords

Non destructive evaluation; Photoreflectance microscopy; Si3N4; Thermal conductivity

Indexed keywords

ANISOTROPY; CERAMIC MATERIALS; COATINGS; GRANULAR MATERIALS; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; NONDESTRUCTIVE EXAMINATION; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL DIFFUSION IN SOLIDS;

EID: 0032658075     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0955-2219(98)00258-1     Document Type: Article
Times cited : (82)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.