High-resolution resonant inelastic x-ray scattering with soft x-rays at the adress beamline of the swiss light source: Instrumental developments and scientific highlights

Journal of Electron Spectroscopy and Related Phenomena

Volumn 188, Issue , 2013, Pages 38-46

  Schmitt, Thorsten ^a   Strocov, Vladimir N ^a   Zhou, Ke Jin ^a   Schlappa, Justine ^a   Monney, Claude ^a   Flechsig, Uwe ^a   Patthey, Luc ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Resonant inelastic x ray scattering vls grating spectrometer correlated electron materials oxide heterostructures charge density wave materials quasi one dimensional cuprates

Indexed keywords

CHARGE DENSITY; CHARGE DENSITY WAVES; HETEROJUNCTIONS; LIGHT SOURCES; SPECTROMETERS; SUN;

CORRELATED ELECTRON MATERIALS; EXPERIMENTAL DEVELOPMENT; GRATING SPECTROMETERS; OXIDE HETEROSTRUCTURES; QUASI-ONE DIMENSIONAL; RESONANT INELASTIC X-RAY SCATTERING; SCATTERING GEOMETRIES; SWISS LIGHT SOURCES;

X RAY SCATTERING;

EID: 84886442803     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2012.12.011     Document Type: Article

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