Concept of a spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies

Journal of Synchrotron Radiation

Volumn 17, Issue 1, 2010, Pages 103-106

  Strocov, V N ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

Free electron lasers; Resonant inelastic X ray scattering; X ray optics; X ray spectrometers

Indexed keywords

BEAM LINES; ORTHOGONAL PLANE; PARALLEL DETECTION; PHOTON ENERGY; RAY TRACING SIMULATION; RESOLVING POWER; RESONANT INELASTIC X-RAY SCATTERING; TECHNICAL IMPLEMENTATION; TIME-RESOLVED; TWO-DIMENSIONAL MAP; UNDULATORS; X-RAY FREE ELECTRON LASERS;

PHOTONS; SCATTERING; SPECTROMETRY; X RAY SCATTERING; X RAY SPECTROMETERS; X RAYS;

X RAY LASERS;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; PHOTON; RADIATION SCATTERING; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SYNCHROTRON; TRANSDUCER; X RAY; X RAY ABSORPTION SPECTROSCOPY;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; PHOTONS; REPRODUCIBILITY OF RESULTS; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; SYNCHROTRONS; TRANSDUCERS; X-RAY ABSORPTION SPECTROSCOPY; X-RAYS;

EID: 73449087622     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509051097     Document Type: Article

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