Data processing for atomic resolution electron energy loss spectroscopy

Microscopy and Microanalysis

Volumn 18, Issue 4, 2012, Pages 667-675

  Cueva, Paul ^a   Hovden, Robert ^a   Mundy, Julia A ^a   Xin, Huolin L ^a   Muller, David A ^a  

^a Cornell University   (United States)

Author keywords

aberration correction; EELS; PCA; software; spectral mapping; STEM

Indexed keywords

EID: 84864776637     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927612000244     Document Type: Conference Paper

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