Direct determination of the effect of strain on domain morphology in ferroelectric superlattices with scanning probe microscopy

Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

  Kathan Galipeau, K ^a   Wu, P P ^b   Li, Y L ^c   Chen, L Q ^b   Soukiassian, A ^d   Zhu, Y ^d   Muller, D A ^d   Xi, X X ^b,e   Schlom, D G ^d   Bonnell, D A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^d Cornell University   (United States)

^e Temple University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC STRAIN; BATIO; DIRECT DETERMINATION; DOMAIN MORPHOLOGY; EFFECT OF STRAIN; ELECTRICAL FIELD; FERROELECTRIC SUPERLATTICE; INTERNAL ELECTRIC FIELDS; PHASE FIELDS; PIEZOELECTRIC RESPONSE; PIEZOFORCE MICROSCOPY; SRTIO; STRAIN STATE; THEORETICAL PREDICTION;

ANISOTROPY; ELECTRIC FIELDS; FORECASTING; MORPHOLOGY; POLARIZATION; SCANNING PROBE MICROSCOPY; SUPERLATTICES;

STRAIN;

EID: 84866412332     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4746081     Document Type: Conference Paper

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