Achieving structural control with thin polystyrene-b-polydimethylsiloxane block copolymer films: The complex relationship of interface chemistry, annealing methodology and process conditions

European Polymer Journal

Volumn 49, Issue 11, 2013, Pages 3445-3454

  O'Driscoll, Benjamin M D ^a   Kelly, Roisin A ^a   Shaw, Matthew ^b,c   Mokarian Tabari, Parvaneh ^b,d   Liontos, George ^e   Ntetsikas, Konstantinos ^e   Avgeropoulos, Apostolos ^e   Petkov, Nikolay ^a   Morris, Michael A ^b,d  

^a UNIVERSITY COLLEGE CORK   (Ireland)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c Intel Ireland Ltd   (Ireland)

^d UNIVERSITY COLLEGE CORK   (Ireland)

^e UNIVERSITY OF IOANNINA   (Greece)

Author keywords

Block copolymer; Cross sectional transmission; Electron microscopy; Evaporation; Microphase separation; Solvent annealing

Indexed keywords

BLOCK COPOLYMER FILMS; COMPLEX RELATIONSHIPS; CONFINEMENT EFFECTS; CROSS-SECTIONAL ELECTRON MICROSCOPY; INTERFACE CHEMISTRY; SOLVENT ANNEALING; STRUCTURAL CONTROL; SUBSTRATE CHEMISTRY;

ANNEALING; BLOCK COPOLYMERS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; EVAPORATION; FILM THICKNESS; MICROCHANNELS; MICROPHASE SEPARATION; MORPHOLOGY; POLYMER FILMS; POLYSTYRENES; SILICONES; SOLVENTS; STRUCTURAL DYNAMICS; SUBSTRATES; SURFACE CHEMISTRY; WETTING;

INTERFACES (MATERIALS);

EID: 84885018327     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2013.07.022     Document Type: Article

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