메뉴 건너뛰기




Volumn 103, Issue 7, 2013, Pages

Probing bias stress effect and contact resistance in bilayer ambipolar organic field-effect transistors

Author keywords

[No Author keywords available]

Indexed keywords

BIAS STRESS; BIAS STRESS EFFECTS; DIRECT CONTACT; ELECTRON TRAPPING; HOLE INJECTION; ORGANIC FIELD-EFFECT TRANSISTOR (OFETS); PENTACENE LAYERS; PENTACENES;

EID: 84882430346     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4818644     Document Type: Article
Times cited : (15)

References (34)
  • 21
    • 70350339679 scopus 로고    scopus 로고
    • 10.1002/adma.200901136
    • H. Sirringhaus, Adv. Mater. 21, 3859 (2009). 10.1002/adma.200901136
    • (2009) Adv. Mater. , vol.21 , pp. 3859
    • Sirringhaus, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.