Bias stress instability in pentacene thin film transistors: Contact resistance change and channel threshold voltage shift

Applied Physics Letters

Volumn 92, Issue 6, 2008, Pages

  Wang, S D ^a   Minari, T ^b   Miyadera, T ^b   Aoyagi, Y ^b   Tsukagoshi, K ^a  

^a RIKEN   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS CURRENTS; CONTACT RESISTANCE; DRAIN CURRENT; STRESS ANALYSIS; THRESHOLD VOLTAGE;

BIAS STRESS INSTABILITY; CONTACT METAL; ORGANIC THIN FILM TRANSISTORS; PENTACENE THIN FILM TRANSISTORS; THRESHOLD VOLTAGE SHIFT; TOP CONTACTS;

THIN FILM TRANSISTORS;

EID: 39349084848     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2844857     Document Type: Article

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