Resistive switching at the nanoscale in the Mott insulator compound GaTa4Se8

Nano Letters

Volumn 13, Issue 8, 2013, Pages 3648-3653

  Dubost, Vincent ^a   Cren, Tristan ^a   Vaju, Cristian ^b   Cario, Laurent ^b   Corraze, Benoiît ^b   Janod, Etienne ^b   Debontridder, François ^a   Roditchev, Dimitri ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b UNIVERSITÉ DE NANTES   (France)

Author keywords

electronic phase separation; Mott memories; Resistive switches; STM

Indexed keywords

ELECTRONIC PHASE SEPARATION; ELECTRONIC TRANSITION; RESISTIVE RANDOM ACCESS MEMORY (RRAM); RESISTIVE SWITCHES; RESISTIVE SWITCHING; RESISTIVE TRANSITION; SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY; STM;

ELECTRIC FIELDS; NANOTECHNOLOGY; PHASE SEPARATION; SWITCHING SYSTEMS;

RANDOM ACCESS STORAGE;

EID: 84881560757     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl401510p     Document Type: Article

References (24)

1. International Technology Roadmap for Semiconductors, http://www.itrs.net/ (2011).
2. Waser, R.; Aono, M. Nat. Mater. 2007, 6, 833
3. Waser, R.; Dittmann, R.; Staikov, G.; Szot, K. Adv. Mater. 2009, 21, 2632-2663
4. Yang, J.; Strukov, D.; Stewart, D. Nat. Nanotechnol. 2012, 8, 13-24
5. Sawa, A. Mater. Today 2008, 11, 28-36
6. Qazilbash, M.; Brehm, M.; Chae, B.; Ho, P.; Andreev, G.; Kim, B.; Yun, S.; Balatsky, A.; Maple, M.; Keilmann, F. Science 2007, 318, 1750
7. Sharoni, A.; Ramirez, J.; Schuller, I. Phys. Rev. Lett. 2008, 101, 26404
8. Driscoll, T.; Kim, H.-T.; Chae, B.-G.; Di Ventra, M.; Basov, D. N. Appl. Phys. Lett. 2009, 95, 043503
9. Cario, L.; Vaju, C.; Corraze, B.; Guiot, V.; Janod, E. Adv. Mater. 2010, 22, 5193
10. Souchier, E.; Cario, L.; Corraze, B.; Moreau, P.; Mazoyer, P.; Estouns, C.; Retoux, R.; Janod, E.; Besland, M.-P. Phys. Status Solidi-Rapid Res. Lett. 2011, 5, 53
11. Tranchant, J.; Janod, E.; Cario, L.; Corraze, B.; Souchier, E.; Leclercq, J.-L.; Cremillieu, P.; Moreau, P.; Besland, M.-P. Thin Solid Films 2013, 533, 61-65
12. Abd-Elmeguid, M. M.; Ni, B.; Khomskii, D.; Pocha, R.; Johrendt, D.; Wang, X.; Syassen, K. Phys. Rev. Lett. 2004, 93, 126403
13. Ben Yaich, H.; Jegaden, J. C.; Potel, M.; Sergent, M.; Rastogi, A. K.; Tournier, R. J. Less-Common Met. 1984, 102, 9
14. Pocha, R.; Johrendt, D.; Ni, B. F.; Abd-Elmeguid, M. M. J. Am. Chem. Soc. 2005, 127, 8732
15. Dorolti, E.; Cario, L.; Corraze, B.; Janod, E.; Vaju, C.; Koo, H.-J.; Kan, E.; Whangbo, M.-H. J. Am. Chem. Soc. 2010, 132, 5704
16. Corraze, B.; Janod, E.; Dorolti, E.; Guiot, V.; Vaju, C.; Koo, H.-J.; Kan, E.; Whangbo, M.-H.; Cario, L. Frontiers in Electronic Materials; Heber, J.; Schlom, D.; Tokura, Y.; Waser, R.; Wuttig, M., Eds.; Wiley-VCH Verlag GmbH & Co. KGaA: Weinheim, Germany, 2012; pp 116-117; DOI: 10.1002/9783527667703. ch33.
17. Vaju, C.; Cario, L.; Corraze, B.; Janod, E.; Dubost, V.; Cren, T.; Roditchev, D.; Braithwaite, D. Adv. Mater. 2008, 20, 2760
18. Vaju, C.; Cario, L.; Corraze, B.; Janod, E.; Dubost, V.; Cren, T.; Roditchev, D.; Braithwaite, D. Microelec. Eng. 2008, 85, 2430
19. Souchier, E.; Cario, L.; Corraze, B.; Moreau, P.; Mazoyer, P.; Estounès, C.; Retoux, R.; Janod, E.; Besland, M.-P. Phys. Status Solidi-Rapid Res. Lett. 2011, 5, 53-55
20. Guiot, V.; Cario, L.; Janod, E.; Corraze, B.; Phuoc, V. T.; Rozenberg, M.; Stoliar, P.; Cren, T.; Roditchev, D. Nat. Commun. 2013, 4, 1722
21. Corraze, B.; Janod, E.; Cario, L.; Moreau, P.; Lajaunie, L.; Stoliar, P.; Guiot, V.; Dubost, V.; Tranchant, J.; Salmon, S.; Besland, M.-P.; Phuoc, V. T.; Cren, T.; Roditchev, D.; Stéphant, N.; Troadec, D.; Rozenberg, M. Eur. Phys. J. Special Top. 2013, 222, 1047-1056
22. Dubost, V.; Cren, T.; Vaju, C.; Cario, L.; Corraze, B.; Janod, E.; Debontridder, F.; Roditchev, D. Adv. Funct. Mater. 2009, 19, 2800
23. Phuoc, V. T.; Vaju, C.; Corraze, B.; Sopracase, R.; Perucchi, A.; Marini, C.; Postorino, P.; Chligui, M.; Lupi, S.; Janod, E.; Cario, L. Phys. Rev. Lett. 2013, 110, 037401
24. McWhan, D. B.; Remeika, J. P. Phys. Rev. B 1970, 2, 3734