SCOPUS 정보 검색 플랫폼

European Physical Journal: Special Topics

Volumn 222, Issue 5, 2013, Pages 1046-1056

Electric field induced avalanche breakdown and non-volatile resistive switching in the Mott Insulators AM4Q8

(17) Corraze, B a Janod, E a Cario, L a Moreau, P a Lajaunie, L a Stoliar, P a,b,c Guiot, V a Dubost, V d Tranchant, J a Salmon, S a Besland, M P a Phuoc, V Ta e Cren, T d Roditchev, D d Stephant N a Troadec, D f Rozenberg, M b

a UNIVERSITÉ DE NANTES (France)

b UNIVERSITÉ PARIS SUD (France)

c UNIVERSIDAD NACIONAL DE SAN MARTÍN (Argentina)

d INSTITUT DES NANOSCIENCES DE PARIS (France)

e Faculty of Sciences and Techniques (France)

f INSTITUT D ELECTRONIQUE (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84880447926 PISSN: 19516355 EISSN: 19516401 Source Type: Journal
DOI: 10.1140/epjst/e2013-01905-1 Document Type: Article

Times cited : (17)

References (37)

1
- 84880412772
- International technology roadmap for semiconductors
- "International technology roadmap for semiconductors" 2011, www. itrs. net.
- (2011)

2
- 35748974883
- R. Waser, M. Aono, Nat. Mater. 6, 833 (2007).
- (2007) Nat. Mater. , vol.6 , pp. 833
- Waser, R.¹ Aono, M.²

3
- 84859999731
- M. Rozenberg, Scholarpedia 6, 11414 (2011).
- (2011) Scholarpedia , vol.6 , pp. 11414
- Rozenberg, M.¹

4
- 43549126477
- A. Sawa, Materials Today 11, 28 (2008).
- (2008) Materials Today , vol.11 , pp. 28
- Sawa, A.¹

5
- 84863158824
- J. Yang, I. Inoue, T. Mikolajick, C. Hwang, MRS Bull. 37, 131 (2012).
- (2012) MRS Bull. , vol.37 , pp. 131
- Yang, J.¹ Inoue, I.² Mikolajick, T.³ Hwang, C.⁴

6
- 84871772858
- J. Yang, D. Strukov, D. Stewart, Nature Nanotechn. 8, 13 (2012).
- (2012) Nature Nanotechn. , vol.8 , pp. 13
- Yang, J.¹ Strukov, D.² Stewart, D.³

7
- 79851501719
- Y. Pershin, M. Di Ventra, Adv. Phys. 60, 145 (2011).
- (2011) Adv. Phys. , vol.60 , pp. 145
- Pershin, Y.¹ Di Ventra, M.²

8
- 54249155606
- A. Lacaita, D. Wouters, Physica Status Solidi (a) 205, 2281 (2008).
- (2008) Physica Status Solidi (a) , vol.205 , pp. 2281
- Lacaita, A.¹ Wouters, D.²

9
- 67650102619
- R. Waser, R. Dittmann, G. Staikov, K. Szot, Adv. Mater. 21, 2632 (2009).
- (2009) Adv. Mater. , vol.21 , pp. 2632
- Waser, R.¹ Dittmann, R.² Staikov, G.³ Szot, K.⁴

10
- 77956252680
- J. Kim, C. Ko, A. Frenzel, S. Ramanathan, J. Hoffman, Appl. Phys. Lett. 96, 213106 (2010).
- (2010) Appl. Phys. Lett. , vol.96 , pp. 213106
- Kim, J.¹ Ko, C.² Frenzel, A.³ Ramanathan, S.⁴ Hoffman, J.⁵

11
- 84873878537
- A. Zimmers, L. Aigouy, M. Mortier, A. Sharoni, S. Wang, K. West, J. Ramirez, I. Schuller, Phys. Rev. Lett. 110, 056601 (2013).
- (2013) Phys. Rev. Lett. , vol.110 , pp. 056601
- Zimmers, A.¹ Aigouy, L.² Mortier, M.³ Sharoni, A.⁴ Wang, S.⁵ West, K.⁶ Ramirez, J.⁷ Schuller, I.⁸

12
- 68249109103
- T. Driscoll, H. Kim, B. Chae, M. Di Ventra, D. Basov, Appl. Phys. Lett. 95, 043503 (2009).
- (2009) Appl. Phys. Lett. , vol.95 , pp. 043503
- Driscoll, T.¹ Kim, H.² Chae, B.³ Di, M.⁴ Basov, D.⁵

13
- 37349052805
- M. Qazilbash, M. Brehm, B. Chae, P. Ho, G. Andreev, B. Kim, S. Yun, A. Balatsky, M. Maple, F. Keilmann, et al., Science 318, 1750 (2007).
- (2007) Science , vol.318 , pp. 1750
- Qazilbash, M.¹ Brehm, M.² Chae, B.³ Ho, P.⁴ Andreev, G.⁵ Kim, B.⁶ Yun, S.⁷ Balatsky, A.⁸ Maple, M.⁹ Keilmann, F.¹⁰

14
- 1242335725
- (Wiley)
- R. Waser, Nanoelectronics and Information Technology (Wiley, 2012).
- (2012) Nanoelectronics and Information Technology
- Waser, R.¹

15
- 78649819746
- L. Cario, C. Vaju, B. Corraze, V. Guiot, E. Janod, Adv. Mater. 22, 5193 (2010).
- (2010) Adv. Mater. , vol.22 , pp. 5193
- Cario, L.¹ Vaju, C.² Corraze, B.³ Guiot, V.⁴ Janod, E.⁵

16
- 84880414894
- (accepted)
- V. Guiot, L. Cario, E. Janod, B. Corraze, V. T. Phuoc, M. Rozenberg, P. Stoliar, T. Cren, D. Roditchev, Nature Comm. (2012) (accepted).
- (2012) Nature Comm
- Guiot, V.¹ Cario, L.² Janod, E.³ Corraze, B.⁴ Phuoc, V.T.⁵ Rozenberg, M.⁶ Stoliar, P.⁷ Cren, T.⁸ Roditchev, D.⁹

17
- 54949120203
- C. Vaju, L. Cario, B. Corraze, E. Janod, V. Dubost, T. Cren, D. Roditchev, D. Braithwaite, O. Chauvet, Adv. Mater. 20, 2760 (2008).
- (2008) Adv. Mater. , vol.20 , pp. 2760
- Vaju, C.¹ Cario, L.² Corraze, B.³ Janod, E.⁴ Dubost, V.⁵ Cren, T.⁶ Roditchev, D.⁷ Braithwaite, D.⁸ Chauvet, O.⁹

18
- 56649088152
- C. Vaju, L. Cario, B. Corraze, E. Janod, V. Dubost, T. Cren, D. Roditchev, D. Braithwaite, O. Chauvet, Microelectronic Eng. 85, 2430 (2008).
- (2008) Microelectronic Eng. , vol.85 , pp. 2430
- Vaju, C.¹ Cario, L.² Corraze, B.³ Janod, E.⁴ Dubost, V.⁵ Cren, T.⁶ Roditchev, D.⁷ Braithwaite, D.⁸ Chauvet, O.⁹

19
- 79251579287
- E. Souchier, L. Cario, B. Corraze, P. Moreau, P. Mazoyer, C. Estournès, R. Retoux, E. Janod, M.-P. Besland, Phys. Status Solidi RRL 5, 53 (2011).
- (2011) Phys. Status Solidi RRL , vol.5 , pp. 53
- Souchier, E.¹ Cario, L.² Corraze, B.³ Moreau, P.⁴ Mazoyer, P.⁵ Estournès, C.⁶ Retoux, R.⁷ Janod, E.⁸ Besland, M.-P.⁹

20
- 84880399144
- E. Souchier, L. Cario, B. Corraze, C. Estournes, V. Fernandez, T. Skotnicki, P. Mazoyer, E. Janod, M.-P. Besland, Proc. IEEE Int. Memory Workshop IMW '09, 1 (2009).
- (2009) Proc. IEEE Int. Memory Workshop IMW '09 , pp. 1
- Souchier, E.¹ Cario, L.² Corraze, B.³ Estournes, C.⁴ Fernandez, V.⁵ Skotnicki, T.⁶ Mazoyer, P.⁷ Janod, E.⁸ Besland, M.-P.⁹

21
- 84880407218
- Memory Workshop (IMW)
- E. Souchier, C. Vaju, V. Guiot, B. Corraze, E. Janod, J. Tranchant, P. Mazoyer, M.-P. Besland, L. Cario, Proc. 3rd IEEE Int. Memory Workshop (IMW), 1 (2011).
- (2011) Proc. 3rd IEEE Int , pp. 1
- Souchier, E.¹ Vaju, C.² Guiot, V.³ Corraze, B.⁴ Janod, E.⁵ Tranchant, J.⁶ Mazoyer, P.⁷ Besland, M.-P.⁸ Cario, L.⁹

22
- 84880437472
- E. Souchier, M. Besland, J. Tranchant, B. Corraze, P. Moreau, R. Retoux, C. Estournès, P. Mazoyer, L. Cario, E. Janod, Thin Solid Films (2012).
- (2012) Thin Solid Filmsaut
- Souchier, E.¹ Besland, M.² Tranchant, J.³ Corraze, B.⁴ Moreau, P.⁵ Retoux, R.⁶ Estournès, C.⁷ Mazoyer, P.⁸ Cario, L.⁹ Janod, E.¹⁰

23
- 0021494239
- H. Yaich, J. Jegaden, M. Potel, M. Sergent, A. Rastogi, R. Tournier, J. Less Common Metals 102, 9 (1984).
- (1984) J. Less Common Metals , vol.102 , pp. 9
- Yaich, H.¹ Jegaden, J.² Potel, M.³ Sergent, M.⁴ Rastogi, A.⁵ Tournier, R.⁶

24
- 20944449869
- R. Pocha, D. Johrendt, B. Ni, M. M. Abd-Elmeguid, J. Am. Chem. Soc. 127, 8732 (2005).
- (2005) J. Am. Chem. Soc. , vol.127 , pp. 8732
- Pocha, R.¹ Johrendt, D.² Ni, B.³ Abd-Elmeguid, M.M.⁴

25
- 77952577032
- E. Dorolti, L. Cario, B. Corraze, E. Janod, C. Vaju, H. Koo, E. Kan, M. Whangbo, J. Am. Chem. Soc. 132, 5704 (2010).
- (2010) J. Am. Chem. Soc. , vol.132 , pp. 5704
- Dorolti, E.¹ Cario, L.² Corraze, B.³ Janod, E.⁴ Vaju, C.⁵ Koo, H.⁶ Kan, E.⁷ Whangbo, M.⁸

26
- 41749124774
- C. Vaju, J. Martial, E. Janod, B. Corraze, V. Fernandez, L. Cario, Chem. Mater. 20, 2382 (2008).
- (2008) Chem. Mater. , vol.20 , pp. 2382
- Vaju, C.¹ Martial, J.² Janod, E.³ Corraze, B.⁴ Fernandez, V.⁵ Cario, L.⁶

27
- 84872331406
- V. Ta Phuoc, C. Vaju, B. Corraze, R. Sopracase, A. Perucchi, C. Marini, P. Postorino, M. Chligui, S. Lupi, E. Janod, et al., Phys. Rev. Lett. 110, 037401 (2013).
- (2013) Phys. Rev. Lett. , vol.110 , pp. 037401
- Ta, V.¹ Vaju, C.² Corraze, B.³ Sopracase, R.⁴ Perucchi, A.⁵ Marini, C.⁶ Postorino, P.⁷ Chligui, M.⁸ Lupi, S.⁹ Janod, E.¹⁰

28
- 19644367914
- M. Abd-Elmeguid, B. Ni, D. Khomskii, R. Pocha, D. Johrendt, X. Wang, K. Syassen, Phys. Rev. Lett. 93, 126403 (2004).
- (2004) Phys. Rev. Lett. , vol.93 , pp. 126403
- Abd-Elmeguid, M.¹ Ni, B.² Khomskii, D.³ Pocha, R.⁴ Johrendt, D.⁵ Wang, X.⁶ Syassen, K.⁷

29
- 0037954432
- J. L. Hudgins, G. S. Simin, E. Santi, M. A. Khan, Power Electronics, IEEE Trans. 18, 907 (2003).
- (2003) IEEE Trans. , vol.18 , pp. 907
- Hudgins, J.L.¹ Simin, G.S.² Santi, E.³ Khan, M.A.⁴

30
- 0037485106
- J. L. Hudgins, J. Electronic Mater. 32, 471 (2003).
- (2003) J. Electronic Mater. , vol.32 , pp. 471
- Hudgins, J.L.¹

31
- 85115722731
- (World Scientific)
- E. Levinshtein, J. Kostamovaara, S. Vainshtein, Breakdown Phenomena in Semiconductors and Semiconductor Devices (World Scientific, 2005).
- (2005) Breakdown Phenomena in Semiconductors and Semiconductor Devices
- Levinshtein, E.¹ Kostamovaara, J.² Vainshtein, S.³

32
- 84880407033
- doi: 10. 1016/j. tsf. 2012. 10. 104
- J. Tranchant, E. Janod, L. Cario, B. Corraze, E. Souchier, J. Leclercq, P. Cremillieu, P. Moreau, M. Besland, Thin Solid Films (2012) doi: 10. 1016/j. tsf. 2012. 10. 104.
- (2012) Thin Solid Films
- Tranchant, J.¹ Janod, E.² Cario, L.³ Corraze, B.⁴ Souchier, E.⁵ Leclercq, J.⁶ Cremillieu, P.⁷ Moreau, P.⁸ Besland, M.⁹

33
- 84880437993
- arXiv preprint [arXiv: 1205. 4548]
- V. Dubost, T. Cren, F. Debontridder, D. Roditchev, C. Vaju, V. Guiot, L. Cario, B. Corraze, E. Janod, arXiv preprint [arXiv: 1205. 4548] (2012).
- (2012)
- Dubost, V.¹ Cren, T.² Debontridder, F.³ Roditchev, D.⁴ Vaju, C.⁵ Guiot, V.⁶ Cario, L.⁷ Corraze, B.⁸ Janod, E.⁹

34
- 69949164512
- V. Dubost, T. Cren, C. Vaju, L. Cario, B. Corraze, E. Janod, F. Debontridder, D. Roditchev, Adv. Funct. Mater. 19, 2800 (2009).
- (2009) Adv. Funct. Mater. , vol.19 , pp. 2800
- Dubost, V.¹ Cren, T.² Vaju, C.³ Cario, L.⁴ Corraze, B.⁵ Janod, E.⁶ Debontridder, F.⁷ Roditchev, D.⁸

35
- 33744521814
- D. B. McWhan, A. Menth, J. P. Remeika, W. F. Brinkman, T. M. Rice, Phys. Rev. B 7, 1920 (1973).
- (1973) Phys. Rev. B , vol.7 , pp. 1920
- McWhan, D.B.¹ Menth, A.² Remeika, J.P.³ Brinkman, W.F.⁴ Rice, T.M.⁵

36
- 84976826673
- F. Aurenhammer, ACM Computing Surveys (CSUR) 23, 345 (1991).
- (1991) ACM Computing Surveys (CSUR) , vol.23 , pp. 345
- Aurenhammer, F.¹

37
- 84880438717
- [arXiv: 1105. 4246] [cs. CG]
- M. M. A. Ferrero [arXiv: 1105. 4246] [cs. CG], (2011).
- (2011)
- Ferrero, M.M.A.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.