On the determination of the emitter saturation current density from lifetime measurements of silicon devices

Progress in Photovoltaics: Research and Applications

Volumn 21, Issue 5, 2013, Pages 850-866

  MäcKel, Helmut ^a   Varner, Kenneth ^a  

^a Centrotherm Cell and Module GmbH   (Germany)

Author keywords

emitter recombination current; minority carrier lifetime; photoconductance measurement; silicon; solar cell

Indexed keywords

CRYSTALLINE SILICONS; EMITTER SATURATION CURRENT DENSITY; ILLUMINATION CONDITIONS; LIFETIME MEASUREMENTS; MINORITY CARRIER LIFETIMES; PHOTOCONDUCTANCE; RECOMBINATION CURRENTS; SHOCKLEY-READ-HALL RECOMBINATIONS;

CARRIER CONCENTRATION; COPYRIGHTS; MATHEMATICAL TECHNIQUES; SILICON; SOLAR CELLS; TWO DIMENSIONAL;

MEASUREMENTS;

EID: 84881219869     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2167     Document Type: Article

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