CMOS tunable-color image sensor with dual-ADC shot-noise-aware dynamic range extension

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 60, Issue 8, 2013, Pages 2116-2129

  Ho, Derek ^a   Noor, M Omair ^a   Krull, Ulrich J ^a   Gulak, Glenn ^a   Genov, Roman ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

CMOS image sensor; fluorescence imaging; lab on a chip; microfluidics; quantum dot; self reset; subranging architecture; two step ADC; wide dynamic range

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; COLOR; DIGITAL TO ANALOG CONVERSION; FLUORESCENCE IMAGING; GREEN MANUFACTURING; IMAGE SENSORS; LAB-ON-A-CHIP; LIGHT ABSORPTION; MEMORY ARCHITECTURE; MICROFLUIDICS; PIXELS; READOUT SYSTEMS; SEMICONDUCTOR QUANTUM DOTS; SIGNAL TO NOISE RATIO;

BROADBAND ILLUMINATION; CMOS IMAGE SENSOR; DYNAMIC RANGE EXTENSION; OPTICAL ABSORPTION PROPERTIES; POLYSILICON GATE STRUCTURE; SELF-RESET; TWO-STEP ADC; WIDE DYNAMIC RANGE;

SHOT NOISE;

EID: 84881114807     PISSN: 15498328     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2013.2239115     Document Type: Article

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