Contact imaging: Simulation and experiment

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 54, Issue 8, 2007, Pages 1698-1710

  Ji, Honghao ^a,b   Sander, David ^a   Haas, Alfred ^a   Abshire, Pamela A ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b CADENCE DESIGN SYSTEMS   (United States)

Author keywords

CMOS analog integrated circuits; Contact imaging; Geometrical optics; Image resolution; Image sensors; Mixed signal analog digital integrated circuits

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; GEOMETRICAL OPTICS; IMAGE QUALITY; IMAGE RESOLUTION; IMAGE SENSORS;

CONTACT IMAGING; MICROSCALE RESOLUTION;

IMAGING TECHNIQUES;

EID: 34547113399     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2007.902409     Document Type: Article

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