Logarithmic response CMOS image sensor with on-chip calibration

IEEE Journal of Solid-State Circuits

Volumn 35, Issue 8, 2000, Pages 1146-1152

  Kavadias, Spyros ^a   Dierickx, Bart ^a   Scheffer, Danny ^a   Alaerts, Andre ^a   Uwaerts, Dirk ^a   Bogaerts, Jan ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; IMAGE QUALITY; IMAGE SENSORS; PHOTOCURRENTS; PHOTODIODES; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE; TRANSISTORS;

ACTIVE PIXEL SENSOR; CMOS IMAGE SENSOR; FIXED PATTERN NOISE; LOGARITHMIC RESPONSE; ON-CHIP CALIBRATION;

INTEGRATED OPTOELECTRONICS;

EID: 0034246307     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.859503     Document Type: Article

References (9)

1. B. Dierickx, D. Scheffer, G. Meynants, W. Ogiers, and J. Vlummens, "Random addressable active pixel image sensors," in Proc. SPIE Advanced Focal Plane Arrays and Electronic Cameras, Europto Berlin 1996, vol. 2950, pp. 2-7.
2. S. Decker, R. D. McGrath, K. Brehmer, and C. Sodini, "A 256 × 256 CMOS imaging array with wide dynamic range pixels and column-parallel digital output," IEEE J. Solid-State Circuits, vol. SC-33, pp. 2081-2091, Dec. 1988.
3. N. Ricquer and B. Dierickx, "Active pixel CMOS image sensor with on-chip nonuniformity correction," in Proc. IEEE Workshop Charge-Coupled Devices and Advanced Image Sensors, Dana Point, CA, Apr. 20-22, 1995.
4. M. Loose, K. Meier, and J. Schemmel, "CMOS image sensor with logarithmic response and self calibrating fixed pattern noise correction," in Proc. SPIE Advanced Focal Plane Arrays and Electronic Cameras, vol. 3410, T. M. Bernard, Ed., 1998, pp. 117-127.
5. _, "Self-calibrating logarithmic CMOS image sensor with single chip camera functionality," in Proc. IEEE Workshop Charge-Coupled Devices and Advanced Image Sensors, Karuizawa, Japan, June 1999, pp. 191-194.
6. S. Kavadias, B. Dierickx, and D. Scheffer, "On-chip offset calibrated logarithmic response image sensor," in Proc. IEEE Workshop Charge-Coupled Devices and Advanced Image Sensors, Karuizawa, Japan, June 1999, pp. 68-71.
7. B. Dierickx, G. Meynants, and D. Scheffer, "Near 100% fill factor CMOS active pixels," in Proc. IEEE Workshop Charge-Coupled Devices and Advanced Image Sensors, Brugge, Belgium, 1997, p. P1.
8. _, "Offset-free offset correction for active pixel sensors," in Proc. IEEE Workshop Charge-Coupled Devices and Advanced Image Sensors, Brugge, Belgium, 1997, p. R13.
9. N. Ricquer and B. Dierickx, "Random addressable CMOS image sensors for industrial applications," Sensors and Actuators A, vol. 44, pp. 29-35, 1994.