Characterization of the cathode objective lens by Real-Space Microspot Low Energy Electron Diffraction

Ultramicroscopy

Volumn 130, Issue , 2013, Pages 2-6

  Tromp, R M ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Aberration; Cathode lens microscopy; LEED; LEEM; PEEM

Indexed keywords

CATHODE LENS; CONTRAST TRANSFER FUNCTION; ELIMINATION OF SAMPLES; GEOMETRIC ABERRATIONS; GEOMETRIC DISTORTION; LEEM; LOW ENERGY ELECTRON MICROSCOPES; PEEM;

ABERRATIONS; CATHODES; GAUSSIAN BEAMS; GEOMETRY; OPTICAL INSTRUMENT LENSES; TRANSMISSION ELECTRON MICROSCOPY;

LOW ENERGY ELECTRON DIFFRACTION;

ARTICLE; CALIBRATION; CATHODE OBJECTIVE LENS; CONTACT ANGLE; ELECTRON BEAM; ELECTRON DIFFRACTION; GEOMETRY; ILLUMINATION; IMAGE DISPLAY; IMAGE QUALITY; OPTICAL INSTRUMENTATION; REAL SPACE MICROSPOT LOW ENERGY ELECTRON DIFFRACTION; REPRODUCIBILITY; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; UNCERTAINTY;

EID: 84880792696     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.02.016     Document Type: Article

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