Ultrafast ellipsometric interferometry for direct detection of coherent phonon strain pulse profiles

Journal of the Optical Society of America B: Optical Physics

Volumn 30, Issue 7, 2013, Pages 1911-1921

  Matsuda, Osamu ^a   Tomoda, Motonobu ^a   Tachizaki, Takehiro ^a   Koiwa, Shun ^a   Ono, Atsushi ^a   Aoki, Kae ^a   Beardsley, Ryan P ^a   Wright, Oliver B ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; INTERFEROMETRY; PHONONS; ULTRASONIC TESTING;

ELECTRON-PHONON COUPLING CONSTANT; INTERFEROMETRIC CONFIGURATION; LONGITUDINAL STRAIN; OPTICAL REFLECTANCE; PICOSECOND ULTRASONICS; QUANTITATIVE EXTRACTION; TWO TEMPERATURE MODEL; ULTRAFAST OPTICAL TECHNIQUES;

STRAIN;

EID: 84879962648     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.30.001911     Document Type: Article

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