Single shot measurements of laser driven shock waves using ultrafast dynamic ellipsometry

Journal of Applied Physics

Volumn 102, Issue 3, 2007, Pages

  Bolme, C A ^a   McGrane, S D ^b   Moore, D S ^b   Funk, D J ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; INTERFEROMETRY; POLYCARBONATES; REFRACTIVE INDEX; SIGNAL TO NOISE RATIO; ULTRAFAST PHENOMENA;

CHIRPED PULSE INTERFEROMETRY; SHOCKED MATERIALS; SHOCKED TRANSPARENT MATERIALS; ULTRAFAST DYNAMIC ELLIPSOMETRY;

SHOCK WAVES;

EID: 34548052031     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2767376     Document Type: Article

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