Significant softening of copper nanowires during electromigration studied by picosecond ultrasound spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 15, 2010, Pages

  Ogi, H ^a   Yamamoto, A ^a   Kondou, K ^b   Nakano, K ^b   Morita, K ^a   Nakamura, N ^a   Ono, T ^b   Hirao, M ^a  

^a OSAKA UNIVERSITY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78149276127     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.155436     Document Type: Article

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