Interferometric detection of ultrafast thermoelastic transients in thin films: Theory with supporting experiment

Journal of the Optical Society of America B: Optical Physics

Volumn 16, Issue 6, 1999, Pages 1007-1015

  Richardson, C J K ^a   Ehrlich, M J ^a   Wagner, J W ^a,b  

^a Johns Hopkins University   (United States)

^b Case Western Reserve University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; FREQUENCY DOMAIN ANALYSIS; INTERFEROMETRY; LASER PULSES; MATHEMATICAL MODELS; REFRACTIVE INDEX; THERMOELASTICITY; THIN FILMS; TIME DOMAIN ANALYSIS; TUNGSTEN; ULTRAFAST PHENOMENA; ULTRASONIC MEASUREMENT;

MICHELSON INTERFEROMETERS; ULTRAFAST THERMOELASTIC TRANSIENTS;

METALLIC FILMS;

EID: 0033244651     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.16.001007     Document Type: Article

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