Structural and electrical properties of Li doped ZnO under Ar/H2 atmosphere

Journal of Sol-Gel Science and Technology

Volumn 65, Issue 2, 2013, Pages 238-242

  Kalyanaraman, S ^a   Thangavel, R ^b   Vettumperumal, R ^a  

^a SRI PARAMAKALYANI COLLEGE   (India)

^b INDIAN SCHOOL OF MINES   (India)

Author keywords

Electrical properties; Thin films; Wurtzite structure; X ray diffraction

Indexed keywords

CRYSTALLINE NATURE; HALL EFFECT MEASUREMENT; IV CHARACTERIZATION; MICROPHOTOLUMINESCENCE; P-TYPE BEHAVIORS; SAPPHIRE SUBSTRATES; STRUCTURAL AND ELECTRICAL PROPERTIES; WURTZITE STRUCTURE;

HALL EFFECT; LITHIUM; PHOTOELECTRONS; PHOTOLUMINESCENCE; SAPPHIRE; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE; ZINC SULFIDE;

ELECTRIC PROPERTIES;

EID: 84879690487     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10971-012-2930-4     Document Type: Article

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