SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 539, Issue , 2013, Pages 55-59

Optical, structural, and morphological characterisation of epitaxial ZnO films grown by pulsed-laser deposition

(8) Mosca, M a Macaluso, R a Cali C a Butte R b Nicolay, S b Feltin, E c Martin, D b Grandjean, N b

a UNIVERSITY OF PALERMO (Italy)

b EPFL (Switzerland)

c Novagan Sàrl ^* (Switzerland)

Author keywords

Photoluminescence; Pulsed laser deposition; Structural properties; Surface roughness; Zinc oxide

Indexed keywords

ATOMIC FORCE MICROSCOPE (AFM); C-AXIS DIRECTION; CRYSTALLINITIES; DIFFERENT SUBSTRATES; HETEROEPITAXIAL; LOW TEMPERATURE PHOTOLUMINESCENCE; PREFERENTIAL GROWTH; ROCKING CURVES;

ATOMIC FORCE MICROSCOPY; DEPOSITION; EPITAXIAL GROWTH; GALLIUM NITRIDE; PHOTOLUMINESCENCE; QUARTZ; SAPPHIRE; STRUCTURAL PROPERTIES; SUBSTRATES; SURFACE ROUGHNESS; THICK FILMS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

PULSED LASER DEPOSITION;

EID: 84879419414 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.04.146 Document Type: Article

Times cited : (27)

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