SCOPUS 정보 검색 플랫폼

Superlattices and Microstructures

Volumn 60, Issue , 2013, Pages 500-507

Plasma-assisted MBE growth of AlN/GaN/AlN heterostructures on Si (1 1 1) substrate

(8) Mohd Yusoff, M Z a,b Mahyuddin, A c Hassan, Z b Yusof, Y b Ahmad, M A b Chin, C W b Hassan, H Abu b Abdullah, M J b

a UNIVERSITI TEKNOLOGI MARA (Malaysia)

b SCHOOL OF PHYSICS (Malaysia)

c UNIVERSITI KUALA LUMPUR (Malaysia)

Author keywords

AlN; EDS line analysis; MBE; TEM; XRD

Indexed keywords

ALN; ENERGY DISPERSIVE X RAY SPECTROSCOPY; HIGH-RESOLUTION X-RAY DIFFRACTION; LINE ANALYSIS; MICROSTRUCTURE PROPERTIES; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; TRANSMISSION ELECTRON MICROSCOPY (TEM); XRD;

CRYSTALLINE MATERIALS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILICON; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

QUALITY CONTROL;

EID: 84879299087 PISSN: 07496036 EISSN: 10963677 Source Type: Journal
DOI: 10.1016/j.spmi.2013.05.034 Document Type: Article

Times cited : (15)

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