An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy

Physica Status Solidi - Rapid Research Letters

Volumn 7, Issue 6, 2013, Pages 406-409

  Lee, Eunjoo ^a   Kim, Minseo ^a   Seong, Jungwoo ^a   Shin, Heungjoo ^b   Lim, Geunbae ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Ulsan National Institute of Science and Technology   (South Korea)

Author keywords

AFM; Carbon nanotubes; Nanoprobes; Scanning electrochemical microscopy; SECM

Indexed keywords

AFM; ELECTROCHEMICAL ACTIVITIES; ELECTROCHEMICAL CURRENTS; FORCE MICROSCOPY; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM; SURFACE SCANNING; TOPOGRAPHICAL IMAGES;

ANALYTIC EQUIPMENT; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; PROBES; SCANNING ELECTRON MICROSCOPY; SCHEMATIC DIAGRAMS;

NANOPROBES;

EID: 84879012908     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201307120     Document Type: Article

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