Nanoscale electron tomography and atomic scale high-resolution electron microscopy of nanoparticles and nanoclusters: A short survey

Progress in Natural Science: Materials International

Volumn 23, Issue 3, 2013, Pages 222-234

  Thomas, John Meurig ^a   Midgley, Paul A ^a   Ducati, Caterina ^a   Leary, Rowan K ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Aberration corrected electron microscopy; Atomic structure; Electron tomography; Nanoclusters; Nanoparticles

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY;

ABERRATION-CORRECTED ELECTRON MICROSCOPY; ATOMIC SCALE; ATOMIC STRUCTURE; ELECTRON TOMOGRAPHY; INTERNAL MORPHOLOGY; INTERNAL STRUCTURE; NANOPARTICLE MATERIALS; NANOSCALE ELECTRONS; STRUCTURE AND MORPHOLOGY; TRANSMISSION ELECTRON;

NANOCLUSTERS;

EID: 84878436878     PISSN: 10020071     EISSN: 17455391     Source Type: Journal    
DOI: 10.1016/j.pnsc.2013.04.003     Document Type: Article

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