Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the angstrom scale

Microscopy Research and Technique

Volumn 74, Issue 7, 2011, Pages 664-670

  Gai, Pratibha L ^a   Yoshida, Kenta ^a   Shute, Carla ^b   Jia, Xiaoting ^c   Walsh, Michael ^a   Ward, Michael ^a   Dresselhaus, Mildred S ^d,e   Weertman, Julia R ^b   Boyes, Edward D ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

^b Northwestern University   (United States)

^c Massachusetts Institute of Technology Cambridge   (United States)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^e Department of Electrical Engineering and Computer Science   (United States)

Author keywords

Aberration corrected electron microscopy; Graphene; In situ aberration corrected microscopy; Nanomaterials; Nanoparticles; Nanotwinned metals; Tetrapods

Indexed keywords

ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE ENHANCEMENT; METAL NANOPARTICLES; NANOSTRUCTURED MATERIALS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

ABERRATION-CORRECTED; ABERRATION-CORRECTED ELECTRON MICROSCOPY; ABERRATION-CORRECTED MICROSCOPIES; COMPOSITIONAL STUDIES; HIGH-ANGLE ANNULAR DARK FIELDS; HIGH-RESOLUTION TEM; IN SITU ABERRATION-CORRECTED MICROSCOPY; NANOTWINNED METALS; STRUCTURAL STUDIES; TETRAPOD;

GRAPHENE;

TETRAPODA;

EID: 79959531798     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20933     Document Type: Article

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