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Volumn 579, Issue , 2013, Pages 50-56

Structural and electronic properties of SnO2

(7) Akgul, Funda Aksoy a,e Gumus, Cebrail b Er, Ali O c Farha, Ashraf H d,f Akgul, Guvenc a Ufuktepe, Yuksel b Liu, Zhi e

a NIGDE UNIVERSITY (Turkey)

b CUKUROVA UNIVERSITY (Turkey)

c UNIVERSITY OF CALIFORNIA (United States)

d Old Dominion University (United States)

e LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

f Ain Shams University (Egypt)

Author keywords

Crystal structure; Electronic properties; Optical properties; Synchrotron radiation; Thin films; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL STRUCTURE; CRYSTALLITE SIZE; ELECTRONIC PROPERTIES; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; SPRAY PYROLYSIS; SUBSTRATES; SYNCHROTRON RADIATION; SYNCHROTRONS; THIN FILMS; TIN; TIN DIOXIDE; X RAY DIFFRACTION;

CHEMICAL COMPONENT; DIAGNOSTIC TECHNIQUES; NON-STOICHIOMETRIC; POLYCRYSTALLINE THIN FILM; SPRAY PYROLYSIS METHOD; STANNIC CHLORIDE; STRUCTURAL AND ELECTRONIC PROPERTIES; UV-VISIBLE ABSORPTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84878391079 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2013.05.057 Document Type: Article

Times cited : (121)

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