Studies on properties of sprayed SnO2 thin films as a function of substrate-nozzle distance and substrate temperature

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 3, Issue 4, 2009, Pages 383-389

  Guneri E ^a   Gumus C ^b   Mansur, F ^b   Kirmizigul F ^a  

^a ERCIYES UNIVERSITY   (Turkey)

^b CUKUROVA UNIVERSITY   (Turkey)

Author keywords

Refractive index; Spray pyrolysis method; Thin films; Tin oxide

Indexed keywords

ENERGY GAP; INFRARED DEVICES; MORPHOLOGY; NOZZLES; OXIDE FILMS; OXIDE MINERALS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; SUBSTRATES; SURFACE MORPHOLOGY; TIN METALLOGRAPHY; TIN OXIDES; TITANIUM DIOXIDE;

ABSORPTION CO-EFFICIENT; EXTINCTION COEFFICIENTS; SPRAY PYROLYSIS METHOD; SUBSTRATE TEMPERATURE; TETRAGONAL RUTILE STRUCTURE; THICKNESS OF THE FILM; TRANSMITTANCE SPECTRA; VISIBLE NEAR INFRARED REGIONS;

THIN FILMS;

EID: 77951998186     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

References (23)

1. B. Ahn, S. Oh, C. Lee, G. Kim, H. Kim, S. Lee, J. Cryst. Grow. 309, 128 (2007).
2. H. L. Ma, X. T. Hao, J. Ma, Y. G. Yang, J. Huang, D. H. Zhang, X. G. Xu, Appl. Surf. Sci. 191, 313 (2002).
3. T. K. Subramanyam, S. Ulthanna, B. S. Naidu, Mater. Lett. 35, 214 (1998).
4. C. Agashe, B. R. Marathe, M. G. Takwale, V. G. Bhide, Thin Solid Films 164, 261 (1988).
5. E. Çetinörgü, C. Gumus, S. Goldsmith, F. Mansur, Appl. and Mater. Sci. 10, 3278 (2007).
6. H. Han, Q. Zhou, J. Wang, Mater. Lett. 60, 252 (2006).
7. T. M. Racheva, G. W. Critchlow, Thin Solid Films 292, 299 (1997).
8. A. K. Mukhopadhyay, P. Mitra, A. P. Chatterjee, H. S. Maiti, Ceram. Int. 26, 123 (2000).
9. A. Pereira, L. Cultrera, A. Dima, M. Susu, A. Perrone, H. L. Du, A. O. Volkov, R. Cutting, P. K. Datta, Thin Solid Films 497, 142 (2006).
10. P. S. Patil, S. B. Sadale, S. H. Mujawar, P. S. Shinde, P. S. Chigare, Appl. Surf. Sci. 253, 8560 (2007).
11. C. Gümüs, O. M. Ozkendir, H. Kavak, Y. Ufuktepe, J. Optoelectron. Adv. Mater. 8, 299 (2006).
12. K. Murakami, K. Nakajima, S. Kaneko, Thin Solid Films 515, 8632 (2007).
13. J. C. Manifacier, J. Gasiot, J. P. Fillard, J. Phys. E: Sci. Instrum. 9, 1002 (1976).
14. R. Swanepoel, J. Phys. E: Sci. Instrum. 16, 1214 (1983).
15. V. Azaroff, M. Buerger, The Powder Method in X- Ray Crystallography, Mc.Graww-Hill Book Company, New York (1958).
16. J. P. Nair, R. Jayakrishnan, N. B. Chaure, R. K. Pandey, Semicond. Sci.Technol. 13, 340 (1998).
17. Joint Committee on Powder Diffraction Standarts, Powder Diffraction File, cards no:41-1445.
18. C. Gumus, C. Ulutas, Y. Ufuktepe, Opt. Mater. 29, 1183 (2007).
19. S. Lee, B. Park, Thin Solid Films 510, 154 (2006).
20. J. Müllerova, J. Mudron, Acta Physical Slovaca 50, 477 (2000).
21. H. Demiryont, K. Nietering, R. Surowiec, F. I. Brown, D. R. Platts, Appl. Opt. 18, 3803 (1987).
22. A. K. Abass, M. T. Mohammad, J. Appl. Phys. 59 (5), 1641 (1986).
23. K. H. Yoon, J. S. Song, Sol. Energy Mater. and Sol. Cells 28, 317 (1993)