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Volumn , Issue , 2012, Pages

Performance of MEMS vibratory gyroscopes in harsh environments

Author keywords

Characterization; Harsh environment; Inertial sensors; Mems gyroscope; Reliability

Indexed keywords

ELEVATED TEMPERATURE; ENVIRONMENTAL CONDITIONS; HARSH ENVIRONMENT; HIGH FREQUENCY ACOUSTICS; INERTIAL SENSOR; MEMS GYROSCOPE; MEMS VIBRATORY GYROSCOPE; MICROELECTROMECHANICAL-SYSTEMS TECHNOLOGIES;

EID: 84877979118     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (18)
  • 3
    • 1542333619 scopus 로고    scopus 로고
    • Harsh military environments and microelectromechanical (MEMS) devices
    • Vol.2
    • T. G. Brown, "Harsh Military Environments and Microelectromechanical (MEMS) Devices, in Proceedings of IEEE Sensors, 2003, vol. 2, pp. 753- 760 Vol.2.
    • (2003) Proceedings of IEEE Sensors , vol.2 , pp. 753-760
    • Brown, T.G.1
  • 9
    • 0035923338 scopus 로고    scopus 로고
    • High-cycle fatigue and durability of polycrystalline silicon thin films in ambient air
    • Nov.
    • C. L. Muhlstein, S. B. Brown, and R. O. Ritchie, "High-cycle fatigue and durability of polycrystalline silicon thin films in ambient air" Sensors and Actuators A: Physical, vol. 94, no. 3, pp. 177-188, Nov. 2001.
    • (2001) Sensors and Actuators A: Physical , vol.94 , Issue.3 , pp. 177-188
    • Muhlstein, C.L.1    Brown, S.B.2    Ritchie, R.O.3
  • 10
    • 11344275297 scopus 로고    scopus 로고
    • Reliability of vacuum packaged MEMS gyroscopes
    • Feb.
    • S. H. Choa, "Reliability of Vacuum Packaged MEMS Gyroscopes" Microelectronics Reliability, vol. 45, no. 2, pp. 361-369, Feb. 2005.
    • (2005) Microelectronics Reliability , vol.45 , Issue.2 , pp. 361-369
    • Choa, S.H.1
  • 17
    • 26044452094 scopus 로고    scopus 로고
    • Reliability of MEMS packaging: Vacuum maintenance and packaging induced stress
    • Jul.
    • S.-H. Choa, "Reliability of MEMS packaging: vacuum maintenance and packaging induced stress" Microsyst Technol, vol. 11, no. 11. pp. 1187-1196, Jul. 2005.
    • (2005) Microsyst Technol , vol.11 , Issue.11 , pp. 1187-1196
    • Choa, S.-H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.