메뉴 건너뛰기




Volumn 102, Issue 17, 2013, Pages

Estimation of residual carrier density near the Dirac point in graphene through quantum capacitance measurement

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED IMPURITY; DIRAC POINT; LINEAR REGION; QUANTUM CAPACITANCE; RESIDUAL CARRIER; RESIDUAL CARRIER DENSITY;

EID: 84877308824     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4804430     Document Type: Article
Times cited : (48)

References (28)
  • 8
    • 33847306075 scopus 로고    scopus 로고
    • 10.1143/JPSJ.75.074716
    • T. Ando, J. Phys. Soc. Jpn. 75, 074716 (2006). 10.1143/JPSJ.75.074716
    • (2006) J. Phys. Soc. Jpn. , vol.75 , pp. 074716
    • Ando, T.1
  • 15
    • 84877289114 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-102-109319 for the detailed fabrication method.
    • See supplementary material at http://dx.doi.org/10.1063/1.4804430 E-APPLAB-102-109319 for the detailed fabrication method.
  • 26
    • 43949143884 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.77.195415
    • S. Frantini and F. Guinea, Phys. Rev. B 77, 195415 (2008). 10.1103/PhysRevB.77.195415
    • (2008) Phys. Rev. B , vol.77 , pp. 195415
    • Frantini, S.1    Guinea, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.