SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 113, Issue 16, 2013, Pages

Impact of Joule heating on the microstructure of nanoscale TiO2 resistive switching devices

(6) Meng Lu, Yi a Noman, Mohammad a Picard, Yoosuf N a Bain, James A a Salvador, Paul A a Skowronski, Marek a

a CARNEGIE MELLON UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE OPERATIONS; HIGH-RESOLUTION TEM; LOW-POWER DISSIPATION; MAXIMUM TEMPERATURE; MICROSTRUCTURAL CHANGES; MORPHOLOGICAL CHANGES; RESISTIVE SWITCHING DEVICES; SCANNING ELECTRONS;

FREE RADICALS; JOULE HEATING; MICROSTRUCTURE; NANOTECHNOLOGY; PLATINUM; SWITCHING SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY;

TITANIUM DIOXIDE;

EID: 84877262939 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4803033 Document Type: Article

Times cited : (34)

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