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Volumn 437, Issue , 2010, Pages 598-602
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Thermal effects of platinum bottom electrodes on PZT sputtered thin films used in MEMS devices
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Author keywords
Annealing treatment; Diffusion; MEMS; PZT
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Indexed keywords
ANNEALING;
DIFFUSION;
ELECTRODES;
LEAD TITANATE;
MEMS;
METALLIC FILMS;
MORPHOLOGY;
PEROVSKITE;
PIEZOELECTRICITY;
PLATINUM;
RECRYSTALLIZATION (METALLURGY);
SUBSTRATES;
SURFACE MORPHOLOGY;
SURFACE TESTING;
TEMPERATURE DISTRIBUTION;
THERMAL EVAPORATION;
THIN FILM CIRCUITS;
VACUUM EVAPORATION;
ANNEALING TEMPERATURES;
ANNEALING TREATMENTS;
PIEZOELECTRIC THIN FILMS;
PLATINUM BOTTOM ELECTRODES;
POST ANNEALING TREATMENT;
PREFERRED ORIENTATIONS;
R.F. MAGNETRON SPUTTERING;
TEMPERATURE DEPENDENCE;
THIN FILMS;
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EID: 77955532116
PISSN: 10139826
EISSN: 16629795
Source Type: Book Series
DOI: 10.4028/www.scientific.net/KEM.437.598 Document Type: Conference Paper |
Times cited : (5)
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References (5)
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