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Volumn 437, Issue , 2010, Pages 598-602

Thermal effects of platinum bottom electrodes on PZT sputtered thin films used in MEMS devices

Author keywords

Annealing treatment; Diffusion; MEMS; PZT

Indexed keywords

ANNEALING; DIFFUSION; ELECTRODES; LEAD TITANATE; MEMS; METALLIC FILMS; MORPHOLOGY; PEROVSKITE; PIEZOELECTRICITY; PLATINUM; RECRYSTALLIZATION (METALLURGY); SUBSTRATES; SURFACE MORPHOLOGY; SURFACE TESTING; TEMPERATURE DISTRIBUTION; THERMAL EVAPORATION; THIN FILM CIRCUITS; VACUUM EVAPORATION;

EID: 77955532116     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/KEM.437.598     Document Type: Conference Paper
Times cited : (5)

References (5)
  • 1
    • 15544370188 scopus 로고    scopus 로고
    • Dielectric, ferroelectric and piezoelectric properties of sputtered PZT thin films on si substrates: Influence of film thickness and orientation
    • T. Haccart, E. Cattan, D. Remiens: Dielectric, ferroelectric and piezoelectric properties of sputtered PZT thin films on Si substrates: influence of film thickness and orientation. Semicond. Phys., Quant Electron. Optoelect. Vol. 5 (2002), pp. 78-88.
    • (2002) Semicond. Phys., Quant Electron. Optoelect. , vol.5 , pp. 78-88
    • Haccart, T.1    Cattan, E.2    Remiens, D.3
  • 2
    • 3242701249 scopus 로고    scopus 로고
    • Ti and TiOx seeding influence on the orientation and ferroelectric properties of sputtered PZT thin films
    • C. Millon, C. Malhaire, D. Barbier: Ti and TiOx seeding influence on the orientation and ferroelectric properties of sputtered PZT thin films. Sens. Actu. Vol. 113 (2004), pp. 376-381.
    • (2004) Sens. Actu. , vol.113 , pp. 376-381
    • Millon, C.1    Malhaire, C.2    Barbier, D.3
  • 4
    • 0033340333 scopus 로고    scopus 로고
    • Characterization of lead zirconate titanate thin film deposition onto pt/Ti/SiO2/Si substrates
    • C.C. Chang, K.H. Chen: Characterization of lead zirconate titanate thin film deposition onto Pt/Ti/SiO2/Si substrates. J. Mat. Sci. Mat. Electr. Vol. 10 (1999), pp. 551-556.
    • (1999) J. Mat. Sci. Mat. Electr. , vol.10 , pp. 551-556
    • Chang, C.C.1    Chen, K.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.