Measurement of thermal conductivity of TiO2 thin films using 3ω method

International Journal of Thermophysics

Volumn 25, Issue 1, 2004, Pages 281-289

  Kim, D J ^a   Kim, D S ^a   Cho, S ^a   Kim, S W ^a   Lee, S H ^b   Kim, J C ^b  

^a University of Ulsan   (South Korea)

^b Korea Research Institute of Standards and Science   (South Korea)

Author keywords

3 method; Thermal conductivity; Thermal resistance; Thin film; TiO 2 film

Indexed keywords

ANTIREFLECTION COATINGS; CHEMICAL SENSORS; HEAT RESISTANCE; LASER APPLICATIONS; MAGNETRON SPUTTERING; MICROSTRUCTURE; MIRRORS; OPTICAL FILTERS; THERMAL CONDUCTIVITY; TITANIUM DIOXIDE;

3Ω METHODS; POWER GENERATORS; SYSTEM PERFORMANCE; TIO2 FILMS;

THIN FILMS;

EID: 3543146701     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:IJOT.0000022340.65615.22     Document Type: Article

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