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Volumn 102, Issue 16, 2013, Pages

Two-dimensional weak anti-localization in Bi2Te3 thin film grown on Si(111)-(7 × 7) surface by molecular beam epitaxy

(9) Roy, Anupam a Guchhait, Samaresh a Sonde, Sushant a Dey, Rik a Pramanik, Tanmoy a Rai, Amritesh a Movva, Hema C P a Colombo, Luigi b Banerjee, Sanjay K a

a The University of Texas at Austin (United States)

b TEXAS INSTRUMENTS (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI-LOCALIZATION EFFECTS; LOGARITHMIC DIVERGENCE; LOW TEMPERATURES; PHASE-COHERENCE LENGTH; POWER-LAW DEPENDENCES; SHARP INCREASE; TOPOLOGICAL INSULATORS; TWO-DIMENSIONAL SYSTEMS;

ELECTRON-ELECTRON INTERACTIONS; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; SILICON; TEMPERATURE; THIN FILMS;

TWO DIMENSIONAL;

EID: 84877002395 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4803018 Document Type: Article

Times cited : (103)

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