Effects of missing low-frequency information on ptychographic and plane-wave coherent diffraction imaging

Applied Optics

Volumn 52, Issue 11, 2013, Pages 2416-2427

  Liu, Haigang ^a,b   Xu, Zijian ^a   Zhang, Xiangzhi ^a   Wu, Yanqing ^a   Guo, Zhi ^a   Tai, Renzhong ^a  

^a SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; WAVE PROPAGATION;

CHARGE COUPLED DETECTORS; COHERENT DIFFRACTION IMAGING; COHERENT DIFFRACTIVE IMAGING; DIFFRACTION SIGNALS; LOW-FREQUENCY SIGNALS; QUALITY OF RECONSTRUCTED IMAGES; SPATIAL RESOLUTION; SYSTEMATIC SIMULATION;

ELASTIC WAVES;

ALGORITHM; ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; INTERFEROMETRY; METHODOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY; PROCEDURES;

ALGORITHMS; ARTIFACTS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INTERFEROMETRY; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY;

EID: 84876770199     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.52.002416     Document Type: Article

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